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Gerard P Mcsweeney

from Gilbert, AZ
Age ~63
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Also known as:
Gerard P Mcs, Gerard Mc Sweeney
Related to:
Sarah M Mcsweeney, 30Omar A Beltran, 46Marcus P Mcsweeney, 32Jack A Mcsweeney, 46Ruth Y Valdivia, 65Ruth M Valdivia, 84Jennifer L Tidd, 46Theresa M Mcpherson, 61Ruth Y Mcsweeney, 65Jodimire N Mcsweeney, 45Theresa M Valdivia, 61
Connected to:
Carolyn J Mcsweeney, 89Ella Mcsweeney, 139Gwendolyn A Mcsween, 73Joanne M Mcsweeney, 61Linda J Mcsweeney, 79Mark R Mcsweeny, 63Matt Mcsweeney, 43Michael D Mcsweeney, 47Nancy L Mcsween, 72Rahman K Mcsween, 46

Gerard Mcsweeney Phones & Addresses

  • Gilbert, AZ
  • 520 Iris Ct, Chandler, AZ 85248
  • 3175 Price Rd, Chandler, AZ 85224
  • 2211 Mariposa St, Chandler, AZ 85224
  • Mesa, AZ
  • Casa Grande, AZ
  • Maricopa, AZ
  • Irvine, CA
  • 520 W Iris Dr, Chandler, AZ 85248

Resumes

Resumes

Gerard Mcsweeney Photo 1

Senior Staff Test Engineer

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Location:
Phoenix, AZ
Industry:
Electrical/Electronic Manufacturing
Work:
Intel since Jun 1997
Senior Staff Test Engineer
Honeywell 1991 - Jun 1997
Senior Test Engineer
Western Digital 1983 - 1991
Test Engineer
Education:
Cork Institute of Technology 1979 - 1983
Skills:
Testing
Semiconductors
Electronics
Debugging
Semiconductor Industry
Firmware
Embedded Systems
Electrical Engineering
Test Engineering
Ic
Manufacturing
Hardware Architecture
Failure Analysis
Embedded Software
Integrated Circuits
Engineering Management
System Testing
Ict
Gerard Mcsweeney Photo 2

Gerard Mcsweeney

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Publications

Us Patents

Method And Apparatus For Controlling A Power Supply

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US Patent:
20040210349, Oct 21, 2004
Filed:
Apr 16, 2003
Appl. No.:
10/417836
Inventors:
Rodney Lenz - Tempe AZ, US
Gerard McSweeney - Chandler AZ, US
International Classification:
G06F019/00
H02J001/00
US Classification:
700/286000, 323/318000
Abstract:
A method for controlling a power supply, the method comprising: forming a front-end to the power supply, the front-end comprising a plurality of digital-to-analog circuits under control of a controller; and programming the controller to control the digital-to-analog circuits to send a user-defined output reference voltage and a user-defined over voltage protection reference voltage to the power supply.

Semiconductor Device Tester With Dut Data Streaming

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US Patent:
20160313370, Oct 27, 2016
Filed:
Jul 28, 2014
Appl. No.:
14/655684
Inventors:
- Santa Clara CA, US
Vineet Pancholi - Chandler AZ, US
Gerard McSweeney - Chandler AZ, US
Shelby Rollins - Hillsboro OR, US
Chris Johnson - Hillsboro OR, US
Nathan Blackwell - Hillsboro OR, US
Bradly L. Inman - Hillsboro OR, US
Steven Lill - Chandler AZ, US
Rodney J. Christner - Phoenix AZ, US
Phillip Barnes - Chandler AZ, US
International Classification:
G01R 1/02
G01R 31/28
G01R 29/26
Abstract:
A method is described that includes configuring multiple test units of a semiconductor device tester with respective information indicating respective storage space within either or both of an off load processing unit and central control unit of the tester. The method further includes streaming DUT data from the test units to their respective storage space within at least one of the off load processing unit and the central control unit such that the test units continually initiate the sending of their respective DUT data to their respective storage space.
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Gerard P Mcsweeney from Gilbert, AZ, age ~63 Get Report