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Kunio Te Otsuka

from San Mateo, CA
Age ~66
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Also known as:
Kunio M Otsuka, Kumio Otsuka
Phone and address:
1440 Overland Dr, San Mateo, CA 94403
Related to:
Minda CarcamoOliver Lawas CarcamoJennifer A O'Hara, 34Ellen Otsuka, 33Shig O'Hara, 62Ryan O'Hara
Connected to:
Dean Otsuka, 36Misato Otsuka, 41Satomi Otsuka, 46Mai Otsuki, 42Scott Otsuki, 66Steven P Otsuki, 76Thalita OtsukiAlea OttAlisha N Ott, 46Anita K Ott, 60

Kunio Otsuka Phones & Addresses

  • 1440 Overland Dr, San Mateo, CA 94403
  • Hayward, CA
  • Burlingame, CA
  • San Jose, CA

Work

Company: Azuma foods international inc Oct 2010 Position: Engineering supervisor

Education

School / High School: Science University of Tokyo Mar 1982 Specialities: BS in Industrial Chemistry

Skills

ISO Coordinator • Database Grograming • GMP • DOE • Six Sigma • FMEA • Gage R&R • CAD2000

Emails

m***[email protected]

Resumes

Resumes

Kunio Otsuka Photo 1

Engineering Supervisor

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Location:
Berkeley, CA
Industry:
Semiconductors
Work:
Azuma Foods International Inc since Oct 2010
Engineering Supervisor
Azuma International since 2010
Eng Manager
Kobe Precision, Inc Feb 1997 - Oct 2010
Quality Engineering Manager / ISO Coordinator
Prosil/Unisil Corporation Sep 1991 - Feb 1997
Engineering Manager
Toshiba Ceramics) Co Apr 1982 - Sep 1991
Assistant Manager of Application Engineering
Education:
Science University of Tokyo 1982
BS, Chemistry Science University of Tokyo 1982
BS, Industrial Chemistry
Skills:
Science
Jvc
Fmea
Quality Assurance
Kunio Otsuka Photo 2

Kunio Otsuka

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Kunio Otsuka Photo 3

Kunio Otsuka

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Kunio Otsuka Photo 4

Kunio Otsuka San Mateo, CA

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Work:
Azuma Foods International Inc

Oct 2010 to 2000
Engineering Supervisor
Kobe Precision, Inc
Hayward, CA
Feb 1997 to Oct 2010
Quality Engineering Manager / ISO Coordinator
Prosil/Unisil Corporation
Santa Clara, CA
Sep 1991 to Feb 1997
Engineering Manager
Covalent Material

Apr 1982 to Sep 1991
Assistant Manager of Application Engineering
Education:
Science University of Tokyo
Mar 1982
BS in Industrial Chemistry
Skills:
ISO Coordinator, Database Grograming, GMP, DOE, Six Sigma, FMEA, Gage R&R, CAD2000

Publications

Us Patents

Method Of Evaluating Quality Of Silicon Wafer And Method Of Reclaiming The Water

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US Patent:
6384415, May 7, 2002
Filed:
Jun 20, 2000
Appl. No.:
09/597577
Inventors:
Tetsuo Suzuki - Kobe, JP
Kunio Otsuka - Hayward CA
Assignee:
Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.) - Kobe
Kobe Precision Inc. - Hayward CA
International Classification:
G01J 502
US Classification:
2503414, 2503415, 250341
Abstract:
A method of evaluating the quality of a silicon wafer is characterized by analyzing a silicon wafer by an infrared absorption spectrum, and then evaluating the quality of the silicon crystal based on an absorbance ratio represented by the following formula (1): wherein absorbances 1 and 2 represent absorbances of the measured silicon wafer, and base line absorbance BL represents the absorbance of a base line of the measured silicon wafer, which is drawn from 1030 to 1170 cm. By using the quality evaluating method of the present invention, internal crystal defects of silicon can be precisely detected in a non-destructive manner. The method of the present invention thus has the advantages of improving productivity, decreasing reclaiming cost, etc.
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Kunio Te Otsuka from San Mateo, CA, age ~66 Get Report