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Brendan Connors Phones & Addresses

  • 43 Holland St, Winchester, MA 01890
  • Medford, MA
  • Jacksonville, FL
  • San Diego, CA
  • Somerville, MA
  • Milton, MA

Work

Company: Brendan M. Connors Address: 340 Forest St., Waltham, MA

Specialities

Civil Law • Personal Injury Law • Collections • Employment Law • Real Estate Law • Estates Law

Professional Records

License Records

Brendan Connors

License #:
53711 - Active
Issued Date:
Mar 7, 2016
Expiration Date:
Jul 31, 2019
Type:
Journeyman Electrician

Lawyers & Attorneys

Brendan Connors Photo 1

Brendan M. Connors, Waltham MA - Lawyer

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Address:
340 Forest St, Waltham, MA 02452
(781) 820-9571 (Office)
Licenses:
Massachusetts - Active 1971
Brendan Connors Photo 2

Brendan Halvor Ekern Connors - Lawyer

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Licenses:
Virginia - Authorized to practice law 2012
Brendan Connors Photo 3

Brendan Connors, Waltham MA - Lawyer

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Office:
Brendan M. Connors
340 Forest St., Waltham, MA
Specialties:
Civil Law
Personal Injury Law
Collections
Employment Law
Real Estate Law
Estates Law
ISLN:
908235078
Admitted:
1971
University:
Boston University, B.A.
Law School:
Suffolk University, J.D.

Resumes

Resumes

Brendan Connors Photo 4

Design Engineer

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Industry:
Sports
Work:
Skis Rossignol
Design Engineer
Brendan Connors Photo 5

Zone Service Leader At Nestlã Waters North America

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Location:
900 Long Ridge Rd, Stamford, CT 06902
Industry:
Food Production
Work:
Nestlé Waters North America
Zone Service Leader at Nestlã Waters North America
Brendan Connors Photo 6

Brendan Connors

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Publications

Isbn (Books And Publications)

Writing a Report

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Author

Brendan Connors

ISBN #

0335018386

Us Patents

Xrf Analyzer

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US Patent:
20080205592, Aug 28, 2008
Filed:
Feb 27, 2007
Appl. No.:
11/711242
Inventors:
Brendan Connors - Somerville MA, US
Brad Hubbard-Nelson - Concord MA, US
Don Sackett - Bedford MA, US
International Classification:
G01N 23/223
US Classification:
378 45
Abstract:
An XRF system, preferably handheld, includes an X-ray source for directing X-rays to a sample, a detector responsive to X-rays emitted by the sample, and a filter assembly with multiple filter materials located between the X-ray source and the detector. An analyzer is responsive to detector and is configured to analyze the intensities of X-rays irradiated by the sample at one power setting and to choose a filter material which suppresses certain intensities with respect to other intensities. A device, controlled by the analyzer, automatically moves the filter assembly to the chosen filter material and then the analyzer increases the power setting to analyze certain non-suppressed intensities.
Brendan M Connors from Winchester, MA, age ~41 Get Report