Inventors:
David A. Gradl - Naperville IL, US
Assignee:
Lattice Semiconductor Corporation - Hillsboro OR
International Classification:
H03D 3/24
US Classification:
375375, 375232, 375345, 375224, 375376, 375230, 713503, 713401
Abstract:
Systems and methods are disclosed herein to provide signal monitoring techniques. For example, in accordance with an embodiment of the present invention, an integrated circuit includes a phase detector circuit that receives an input signal and samples the input signal to provide binary state signals. A signal monitoring circuit decodes the binary state signals and provides at least one output signal indicating for the input signal path equalization and/or duty cycle distortion.