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Eric W Rouse

from Mount Washington, KY
Age ~59
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Also known as:
Eric Wade Rouse
Phone and address:
244 Spring Dr, Mount Washington, KY 40047
(502) 538-6481
Related to:
Aleisa A Rouse, 59Abigail R Schuhmann, 34Jeffrey Gardner, 55Maryellen E Gardner, 60Christopher Gardner, 53Theresa Wiggins, 63
Connected to:
Devon S Rouse, 33Elijah Rouse, 61Felica Rouse, 62Hellen B Rouse, 118Jasmine A Rouse, 35Jeanne M Rouse, 78Jessilee Rouse, 40Jodie L Rouse, 50Katrina W Rouse, 45Lamont A Rouse, 55

Eric Rouse Phones & Addresses

  • 244 Spring Dr, Mount Washington, KY 40047 (502) 538-6481 (502) 904-0743
  • Mt Washington, KY
  • Louisville, KY
  • Inlet Beach, FL
  • Elgin, IL
  • 244 Spring Dr, Mt Washington, KY 40047

Work

Position: Sales Occupations

Education

Degree: High school graduate or higher

Resumes

Resumes

Eric Rouse Photo 1

Inside Global Sales Manager

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Location:
Louisville, KY
Industry:
Oil & Energy
Work:
Ge Parts and Repair Services Nov 1985 - Sep 2011
Test Development Engineer
Ge Oil & Gas Nov 1985 - Sep 2011
Inside Global Sales Manager
Motorola High Tech Service Center May 1984 - Nov 1985
Test Engineer
Education:
Rets Radio Electronic Television School 1982 - 1984
Associates, Engineering
Skills:
Microsoft Office
Management
Microsoft Excel
Microsoft Word
Research
Powerpoint
Sales
Leadership
Training
Eric Rouse Photo 2

Eric Rouse

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Eric Rouse Photo 3

Eric Rouse

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Location:
9540 Green Cypress Ln, Fort Myers, FL 33905
Industry:
Construction
Eric Rouse Photo 4

Eric Rouse

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Eric Rouse Photo 5

Eric Rouse

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Eric Rouse Photo 6

Eric Rouse

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Eric Rouse Photo 7

Eric Rouse

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Publications

Us Patents

Test Circuit And System

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US Patent:
20110163760, Jul 7, 2011
Filed:
Jan 6, 2010
Appl. No.:
12/683064
Inventors:
ERIC WADE ROUSE - MOUNT WASHINGTON KY, US
PAUL DOUGLAS KELLEY - LOUISVILLE KY, US
Assignee:
GENERAL ELECTRIC COMPANY - SCHENECTADY NY
International Classification:
G01R 31/02
US Classification:
324555
Abstract:
A test circuit and system for testing one or more electrical properties of an electronic circuit or other device under test (DUT) by applying and monitoring test signals to the DUT is disclosed. The test circuit can utilize a plurality of universal interface channel circuits in a single automated test system to provide a unique and flexible approach for testing electronic circuits or devices that has many advantages. A single data acquisition circuit can coupled to one or more universal interface channel circuits. Each of the universal interface channel circuits can be independently commanded by the data acquisition circuit to provide one of a variety of test signals to a DUT as desired.
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Eric W Rouse from Mount Washington, KY, age ~59 Get Report