Ian C Shay

6781387, Aug 24, 2004

Aug 20, 2002

10/225406

Neil J. Goldfine - Newton MA
Darrell E. Schlicker - Watertown MA
Markus Zahn - Lexington MA
Wayne D. Ryan - Pembroke MA
Ian C. Shay - Cambridge MA
Andrew Washabaugh - Menlo Park CA

Jentek Sensors, Inc. - Waltham MA

G01R 2726

324658, 324663, 324 711

Described is an inspection method for detecting defects in dielectic test materials using a penetrant material and a dielectric sensor. The penetrant material provides differing dielectric properties from test material and improves the dielectric contrast between defects substantially filled by the penetrant and the test material. The penetrant can be a liquid, such as water, or a powder, as long as it provides a substantially different complex permittivity than the test material.

6784662, Aug 31, 2004

Mar 19, 2002

10/102620

Darrell E. Schlicker - Watertown MA
Neil J. Goldfine - Newton MA
Andrew P. Washabaugh - Chula Vista CA
Karen E. Walrath - Arlington MA
Ian C. Shay - Cambridge MA
David C. Grundy - Reading MA
Mark Windoloski - Burlington MA

Jentek Sensors, Inc. - Waltham MA

G01N 2772

324242, 324239, 324243

An apparatus for the nondestructive measurements of materials. Eddy current sensing arrays are described which provide a capability for high resolution imaging of test materials and also a high probabilitity of detection for defects. These arrays incorporate layouts for the sensing elements which take advantage of microfabrication manufacturing capabilities for creating essentially identical sensor arrays, aligning sensing elements in proximity to the drive elements, and laying out conductive pathways that promote cancellation of undesired magnetic flux.

6992482, Jan 31, 2006

Nov 8, 2001

10/045650

Ian Shay - Cambridge MA, US
Neil J. Goldfine - Newton MA, US
Andrew P. Washabaugh - Chula Vista CA, US
Darrell E. Schlicker - Watertown MA, US

Jentek Sensors, Inc. - Waltham MA

G01N 27/82
G01R 33/12

324235, 324232, 324248, 324240

Magnetic field sensor probes are disclosed which comprise primary or drive windings having a plurality of current carrying segments. The relative magnitude and direction of current in each segment are adjusted so that the resulting interrogating magnetic field follows a desired spatial distribution. By changing the current in each segment, more than one spatial distribution for the magnetic field can be imposed within the same sensor footprint. Example envelopes for the current distributions approximate a sinusoid in Cartesian coordinates or a first-order Bessel function in polar coordinates. One or more sensing elements are used to determine the response of a test material to the magnetic field. These sense elements can be configured into linear or circumferential arrays.

6995557, Feb 7, 2006

Feb 27, 2004

10/788526

Neil J. Goldfine - Newton MA, US
Vladimir A. Zilberstein - Chestnut Hill MA, US
Darrell E. Schlicker - Watertown MA, US
David C. Grundy - Reading MA, US
Ian Shay - Cambridge MA, US
Andrew P. Washabaugh - Chula Vista CA, US

JENTEK Sensors, Inc. - Waltham MA

G01N 27/82
G01R 33/12

324232, 324240

A sensor that characterizes welds in materials. The sensor includes a meandering drive winding with at least three extended portions and at least one sensing element placed between an adjacent pair of extended portions. A time varying electric current is passed through the extended portions to form a magnetic field. The sensor is placed in proximity to the test material and translated over the weld region. An electrical property of the weld region is measured for each sensing element location. The weld quality is determined using a feature of the electrical property measurement and location.

7049811, May 23, 2006

Jun 23, 2004

10/876002

Darrell E. Schlicker - Watertown MA, US
Neil J. Goldfine - Newtown MA, US
Andrew P. Washabaugh - Chula Vista CA, US
Karen E. Walrath - Arlington MA, US
Ian C. Shay - Cambridge MA, US
David C. Grundy - Reading MA, US
Mark Windoloski - Burlington MA, US

JENTEK Sensors, Inc. - Waltham MA

G01N 27/72
G01N 27/82
G01R 33/12

324242, 324239, 324243

A test circuit having a drive winding with parallel conducting segments and a plurality of sense elements used for the nondestructive measurement of materials. The drive winding segments have extended portions and are driven by a time varying electric current to impose a magnetic field in the test material. Sense elements are distributed in a direction parallel to the extended portions of these drive segments, with separate connections provided to each sense element. A second plurality of sense elements may also be distributed parallel to the extended portions of the drive windings, being either aligned or offset from a first plurality of sense elements.

7161351, Jan 9, 2007

Sep 3, 2004

10/934103

Neil J. Goldfine - Newton MA, US
Vladimir A. Zilberstein - Chestnut Hill MA, US
Darrell E. Schlicker - Watertown MA, US
David C. Grundy - Reading MA, US
Ian C. Shay - Waltham MA, US
Robert J. Lyons - Boston MA, US
Andrew P. Washabaugh - Chula Vista CA, US

Jentek Sensors, Inc. - Waltham MA

G01R 33/12

324242, 324240, 324226, 228102

Quasistatic sensor responses may be converted into multiple model parameters to characterize hidden properties of a material. Methods of conversion use databases of responses and, in some cases, databases that include derivatives of the responses, to estimate at least three unknown model parameters, such as the electrical conductivity, magnetic permeability, dielectric permittivity, thermal conductivity, and/or layer thickness. These parameter responses are then used to obtain a quantitative estimate of a property of a hidden feature, such as corrosion loss layer thicknesses, inclusion size and depth, or stress variation. The sensors can be single element sensors or sensor arrays and impose an interrogation electric, magnetic, or thermal field.

7183764, Feb 27, 2007

Aug 28, 2003

10/650486

Neil J. Goldfine - Newton MA, US
Darrell E. Schlicker - Watertown MA, US
Vladimir Tsukernik - West Roxbury MA, US
Ian C. Shay - Cambridge MA, US
David C. Grundy - Reading MA, US
Andrew P. Washabaugh - Chula Vista CA, US

JENTEK Sensors, Inc. - Waltham MA

G01N 27/82
G01N 27/72

324238, 324219

Described are methods for pressurizing elastic support structures or balloons in sensor probes used for the inspection of components having areas of limited access. When inflated, the balloons press flexible sensors against the surface of the material under test. When deflated, the balloons permit easier insertion of the probes into the component and reduce the mechanical stresses on the sensors, thereby extending the sensor lifetime. By sequentially partially inserting the sensor into a limited access area from either side of the limited access area and scanning in opposite directions, the entire surface of the test material can be inspected.

7188532, Mar 13, 2007

Sep 8, 2004

10/937105

Neil J. Goldfine - Newton MA, US
Vladimir A. Zilberstein - Chestnut Hill MA, US
David C. Grundy - Reading MA, US
Andrew P. Washabaugh - Chula Vista CA, US
Darrell E. Schlicker - Watertown MA, US
Ian C. Shay - Waltham MA, US
Robert J. Lyons - Boston MA, US
Christopher A. Craven - Bedford MA, US
Christopher Root - Boulder CO, US
Mark D. Windoloski - Burlington MA, US
Volker Weiss - Syracuse NY, US

Jentek Sensors, Inc. - Waltham MA

G01B 7/16

73779

Observability of damage precursor, damage and usage states, or event occurrence may be enhanced by modifying component materials to include self-monitoring materials or by processing test material to alter the surface properties. The properties of the self monitoring materials, such as magnetic permeability or electrical conductivity, are monitored with electromagnetic sensors and provide greater property variations with component condition than the original component material. Processing includes shot peening or laser welding.