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Malvin Carl Teich

from Boston, MA
Age ~85
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Also known as:
Malvin C Teich, Carl Malvin Teich, Malvin Carl Teich Ret, Malvin Carl Teich Revocable, Melvin C Teich, Carl Teich Malvin
Phone and address:
70 Montgomery St, Boston, MA 02116
(617) 262-0693
Related to:
Tiffany R Edwards, 42
Connected to:
Christy R Teich, 54Marnie S Teich, 38Timothy A Teich, 67John Teicheira, 59Cindy B Teichen, 55Ronnie F Teichelman, 78Harold Teichman, 113Larry TeichmanLindsey L Teichman, 40Marek Teichmann, 58

Malvin Teich Phones & Addresses

  • 70 Montgomery St, Boston, MA 02116 (617) 262-0693
  • 70 Montgomery St APT 2, Boston, MA 02116 (617) 262-0377
  • 282 4Th St, New York, NY 10014
  • Fort Lauderdale, FL
  • Sayville, NY
  • Babylon, NY
  • Ithaca, NY
  • 70 Montgomery St, Boston, MA 02116 (617) 510-1801

Work

Company: Boston university Sep 2011 Position: Professor emeritus

Education

Degree: Doctorates, Doctor of Philosophy School / High School: Cornell University 1962 to 1966 Specialities: Electrical Engineering, Applied Physics, Philosophy

Languages

English • French • German • Spanish • Russian

Industries

Higher Education

Resumes

Resumes

Malvin Teich Photo 1

Professor Emeritus

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Location:
Boston, MA
Industry:
Higher Education
Work:
Boston University
Professor Emeritus
Boston University Sep 1995 - Aug 2011
Professor
Columbia University In the City of New York Sep 1995 - Aug 2011
Professor Emeritus
Columbia University In the City of New York Sep 1967 - Aug 1996
Professor
Mit Lincoln Laboratory Feb 1966 - Aug 1967
Research Scientist
Education:
Cornell University 1962 - 1966
Doctorates, Doctor of Philosophy, Electrical Engineering, Applied Physics, Philosophy Stanford University 1961 - 1962
Master of Science, Masters, Electrical Engineering Massachusetts Institute of Technology 1957 - 1961
Languages:
English
French
German
Spanish
Russian

Business Records

Name / Title
Company / Classification
Phones & Addresses
Malvin C. Teich
Professor
Trustees of Boston University
College/University
110 Cummington St, Boston, MA 02215

Publications

Isbn (Books And Publications)

Fundamentals of Photonics

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Author

Malvin Carl Teich

ISBN #

0471213748

Fundamentals of Photonics

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Author

Malvin Carl Teich

ISBN #

0471358320

Fractal-Based Point Processes

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Author

Malvin Carl Teich

ISBN #

0471383767

Fractal-Based Point Processes

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Author

Malvin Carl Teich

ISBN #

0471754706

Fundamentals of Photonics

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Author

Malvin Carl Teich

ISBN #

0471839655

Us Patents

Polarization Mode Dispersion Characterization Apparatus And Method

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US Patent:
6646727, Nov 11, 2003
Filed:
May 16, 2002
Appl. No.:
10/147149
Inventors:
Bahaa E. A. Saleh - Lexington MA, 02420
Malvin C. Teich - Boston MA, 02116
Alexander Sergienko - Boston MA, 02115
Steven J. Bielagus - South Walpole MA, 02071
Milan J. Merhar - Brookline MA, 02445
International Classification:
G01N 2100
US Classification:
356 731
Abstract:
The invention relates to an entangled-photon apparatus capable of measuring particular characteristics of an optical element, device or channel. Specifically, the apparatus and a method of using said apparatus to measure polarization mode dispersion in an optical communications fiber is disclosed. The apparatus includes a source of entangled photons, which are injected into the device under test, and a quantum interference device for determining the state of entanglement of said photons after they pass through the device. The quantum interference device includes a variable, polarization-specific delay element that is incremented to null out polarization mode dispersion in the device under test, and a wavelength demultiplexer/array detector that permits simultaneous measurements across a wide wavelength band. A second preferred embodiment of the invention and method is suitable for characterizing PMD in-situ that is, PMD measurements can be made while an optical fiber is in use for optical communications.

Entangled-Photon Ellipsometry

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US Patent:
6822739, Nov 23, 2004
Filed:
May 20, 2003
Appl. No.:
10/441889
Inventors:
Alexander V. Sergienko - Boston MA
Bahaa E. A. Saleh - Lexington MA
Malvin C. Teich - Boston MA
Ayman F. Abouraddy - Boston MA
Assignee:
Trustees of Boston University - Boston MA
International Classification:
G01J 400
US Classification:
356369, 356368
Abstract:
A system for obtaining ellipsometric data from a sample. The system includes a source for providing a monochromatic light beam. The system also includes a nonlinear crystal for converting the monochromatic light beam into photon pairs by disintegrating photons from the monochromatic light beam, such that each of the photon pairs exhibits entanglement properties, wherein one of the photons of the pair is directed to the sample and the other of the photons of the pair is not directed to the sample. The system further includes a circuit for calculating the coincidence of one of the photons of the photon pair reflected from the sample and the other of the photons of the photon pair, wherein the measurements of the sample are obtained by analyzing the coincidence and the entanglement properties between one of the photons of the photon pair reflected from the sample and the other of the photons of the photon pair.

Quantum Optical Coherence Tomography Data Collection Apparatus And Method For Processing Therefor

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US Patent:
6882431, Apr 19, 2005
Filed:
Nov 26, 2002
Appl. No.:
10/304985
Inventors:
Malvin C. Teich - Boston MA, US
Bahaa E A. Saleh - Lexington MA, US
Alexander V. Sergienko - Boston MA, US
Ayman F. Abouraddy - Boston MA, US
Magued B. Nasr - Allston MA, US
International Classification:
G01B009/02
US Classification:
356497
Abstract:
The disclosed Quantum Optical Coherence Tomography apparatus and method includes a source of quantum entangled photons and a quantum interference device. The pair of entangled photons is divided into two beams, one of which illuminates a semi-reflective object and the second of which is reflected from a variable optical time-delay element (VTE). The VTE is scanned and the quantum interference in the QID is recorded to build up a reflectance profile of the object. A real scanning produces a full tomographic reflectance image. A method of processing the data to eliminate the effects of optical dispersion is disclosed.

High-Flux Entangled Photon Generation Via Parametric Processes In A Laser Cavity

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US Patent:
6982822, Jan 3, 2006
Filed:
May 22, 2003
Appl. No.:
10/443262
Inventors:
Malvin C. Teich - Boston MA, US
Bahaa E. A. Saleh - Lexington MA, US
Alexander V. Sergienko - Boston MA, US
John T. Fourkas - Brookline MA, US
Ralf Wolleschensky - Schoeten, DE
Michael Kempe - Kunitz, DE
Mark C. Booth - Cambridge MA, US
Assignee:
Trustees of Boston University - Boston MA
The Trustees of Boston College - Chesnut Hill MA
Carl Zeiss Jena GmbH
International Classification:
G02F 1/39
G02F 1/37
US Classification:
359330, 359328
Abstract:
An apparatus for generating a strong source of doubly or multiply entangled photons emitted non-collinearly or collinearly with respect to the pump light that is at frequency 2f includes a laser medium producing classical laser light at fundamental frequency f. A medium for second harmonic generation transforms the light at fundamental frequency f to its second-harmonic frequency 2f and emitting entangled photons non-colinearly with respect to the light at the second harmonic frequency. An optical cavity element around the laser medium and the medium for second harmonic generation includes of at least two mirrors that are highly reflective at the light frequencies f and 2f. A parametric process or a set of simultaneous parametric processes are used to generate the entangled photons at light frequencies around including at least one optical cavity resonant at frequency 2f at least around the medium for entangled photon generation, comprising of at least two mirrors that are highly reflective at the light frequency 2f.

Three-Dimensional Fabrication Using Entangled-Photon Lithography

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US Patent:
20020093632, Jul 18, 2002
Filed:
Aug 25, 2001
Appl. No.:
09/939017
Inventors:
Malvin Teich - Boston MA, US
Bahaa Saleh - Lexington MA, US
Alexander Sergienko - Boston MA, US
John Fourkas - Chestnut Hill MA, US
International Classification:
G03B027/00
G03F007/20
US Classification:
355/018000, 430/322000, 430/394000, 355/077000
Abstract:
The present invention relates to novel three-dimensional fabrication using entangled-photon lithography. The systems include a source of light that produces twin or multiply entangled photons. The systems also include optical components that direct the twin or multiply entangled photons towards an interaction region. The interaction region includes absorption means responsive to a particular range of energies, which approximately equals the sum of the energies of the entangled photons. The systems may further include fabrication means in the interaction region that are responsive to physical and/or chemical changes of material or materials in this region, including the deposition or addition of one or more species, the removal of one or more species, the combination of two or more species, and/or the conversion of one species to another. The present invention also relates to methods for the three-dimensional fabrication of a structure through the use of twin or multiply entangled photons, at least some of which are spatially distinct from one another after their generation. The entangled photons are directed to come together at the interaction region, thereby allowing the absorption of entanglement-related photons at selected and adjustable points, in three dimensions, in the structure to be fabricated.

Entangled-Photon Microscopy, Spectroscopy, And Display

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US Patent:
57964777, Aug 18, 1998
Filed:
Feb 27, 1997
Appl. No.:
8/807395
Inventors:
Malvin Carl Teich - Boston MA
Bahaa E. A. Saleh - Lexington MA
Assignee:
Trustees of Boston University - Boston MA
International Classification:
G01N 2163
US Classification:
356318
Abstract:
The present invention relates to novel entangled-photon microscopy, spectroscopy and display systems. The systems include a source of light in the form of twin or multiple entangled-photon beams. The systems also include optical components that direct the twin or multiple entangled-photon beams towards a target material. The target material includes emission or indicator means responsive to an energy, which approximately equals the sum of the energies of the entangled photons. The systems may further include imaging means that is sensitive to the response of the target material. The present invention also relates to novel correlated-photon microscopy, spectroscopy and display systems. The present invention further relates to methods of correlated-photon microscopy in which a pump beam of photons is provided. A portion of the pump beam is split into a first beam and a second beam, the beams having corresponding correlated photons.
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Malvin Carl Teich from Boston, MA, age ~85 Get Report